AWG G3 PAD FOR PS3 Especificações descarregar pdf (Página 11)

List Of Figures

System Reference, January 2001

List Of Figures

Figure 1 P- and C-Models of the Agilent93000 SOC Series 18

Figure 2 The Agilent 93000 SOC Series Tester 19

Figure 3 Test Processor-per-pin Architecture 20

Figure 4 SOC System Integration 21

Figure 5 SOC Series Model with 960/1024 Pins Testhead 23

Figure 6 SOC Series Model with 448 Pins Testhead 24

Figure 7 Agilent 93000 SOC Series Testhead 25

Figure 8 Manipulator 26

Figure 9 Support Rack 27

Figure 10 Cooling Unit 28

Figure 11 HP Workstation 29

Figure 12 ON/OFF Switches on Support Rack Front Panel 32

Figure 13 ON Button 33

Figure 14 Standby Button 35

Figure 15 Line Switch in OFF position 35

Figure 16 Tester Electronics Inside a 512 Pins Testhead 39

Figure 17 DPS Connection 40

Figure 18 Channel Boards 41

Figure 19 Channel Board Electronics 42

Figure 20 Clock Board 43

Figure 21 Pin PMU and Board ADC 45

Figure 22 Multiplexed AD Conversion of Parallel Pin PMU Measurements 46

Figure 23 Connecting the High-Precision PMU to a Channel Board 47

Figure 24 Coherent Sampling 49

Figure 25 Master Clock Distribution on 512-Pin Testhead 53

Figure 26 Master Clock Distribution on 1024-Pin Testhead 54

Figure 27 Card Cage Positions within Test Head (Topview from DUT Board

Side) above their Corresponding SOC Series Testers.

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Figure 28 Input of a card cage 60

Figure 29 Position of DUT board above the Test Head. 61

Figure 30 DUT board options depending on test head size 63

Figure 31 1. Allocation of the 512 pin DUT board’s groups to the card cages of

the 512 pin test head. 2. Numbering of pairs of pad blocks.

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Figure 32 1. Allocation of the 1024 pin DUT board’s groups to the card cages

of the 1024 pin test head. 2. Numbering of pairs of pad blocks.

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Figure 33 A Pair of Pad Blocks (No. 228) 67

1 2 ... 6 7 8 9 10 11 12 13 14 15 16 ... 284 285

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AWG G3 PAD FOR PS3 Especificações Página 11